A unified OLED aging model combining three modeling approaches for extending AMOLED lifetime
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Abstract
Abstract Aging is still the most challenging issue for organic light‐emitting diodes (OLEDs), which causes the image‐sticking artifacts on active‐matrix organic light‐emitting diode (AMOLED) displays and limits their lifetime. To overcome this demerit, an aging model is necessary to compensate for aging artifacts. In this paper, we present a unified OLED aging model, which combines three feasible modeling approaches of OLED degradation, namely, data‐counting, electro‐optical, and correlation methods. The model can be used to predict the efficiency decay of OLED pixels during operation. It mitigates weaknesses and limitations of each of these three models and deploys their strengths, respectively. In the first aging stage, the data‐counting model is prioritized, and in the later stages, it is calibrated using the correlation model. The dependency of the efficiency decay on the operation point of OLED is covered by the electro‐optical model. The unified model is based on both phenomenal and physical effects. It delivers more reliability to determine an OLED's degradation over a long‐term operation and a wide operation range like current amplitude and/or temperature range. The unified aging model applies to either an analog or a digital driving scheme. A corresponding compensation based on the aging model can be applied for extending the AMOLED lifetime.
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