P‐68: Analysis and Solution of Horizontal Line Defect Occurred During Reliability Test in 55' UD TFT‐LCD TV with a‐Si Integrated Gate Driver Technology
SID Symposium Digest of Technical Papers2017Vol. 48(1), pp. 1498–1501
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Limei Zeng, XiaoWen Lyv, Shujhih Chen, Yi-Fang Chou, Chia-Yu Lee, Xiang Liu, XiaoDi Liu, Ren-Lu Chen, Congwei Liao, Tianhong Wang
Abstract
Analysis results demonstrates in this paper for gradation horizontal line (H‐line) occurred in reliability (aging) test on amorphous silicon TFT‐LCDs with integrated gate driver technology (short as GOA circuit). There are two factors that induce H‐line: GOA gate output and data inversion type. Changing these two factors could eliminate or relieve H‐line defect.
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