Mass spectrometric analysis of ceramic components for solid oxide fuel cells
Microchimica Acta1997Vol. 125(1-4), pp. 153–160
Citations Over TimeTop 15% of 1997 papers
Johanna Sabine Becker, J. Westheide, Anatolij I. Saprykin, H. Holzbrecher, U. Breuer, Hans -Joachim Dietze
Related Papers
- → Organic film thickness effect in secondary ion mass spectrometry and plasma desorption mass spectrometry(1992)25 cited
- → Investigation of surface layers by SIMS and SIIMS(1973)47 cited
- → Secondary Ion Mass Spectrometry for Surface Analysis(2008)
- → Secondary Ion Mass Spectrometry as Related to Surface Analysis(2000)
- Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995(1997)