Electrodeposition of Epitaxial Cu(111) Thin Films on Au(111) Using Defect-Mediated Growth

Citations Over TimeTop 17% of 2001 papers

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVCommunicationNEXTElectrodeposition of Epitaxial Cu(111) Thin Films on Au(111) Using Defect-Mediated GrowthSeongpil Hwang, Ilwhan Oh, and Juhyoun KwakView Author Information Department of Chemistry Korea Advanced Institute of Science and Technology (KAIST) 373-1 Kusong-dong Yusong-gu Taejon 305-701 South Korea Cite this: J. Am. Chem. Soc. 2001, 123, 29, 7176–7177Publication Date (Web):June 27, 2001Publication History Received13 February 2001Revised17 May 2001Published online27 June 2001Published inissue 1 July 2001https://pubs.acs.org/doi/10.1021/ja015666nhttps://doi.org/10.1021/ja015666nrapid-communicationACS PublicationsCopyright © 2001 American Chemical SocietyRequest reuse permissionsArticle Views1327Altmetric-Citations41LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-AlertscloseSupporting Info (1)»Supporting Information Supporting Information SUBJECTS:Deposition,Electrodeposition,Epitaxy,Scanning tunneling microscopy,Thin films Get e-Alerts

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