Long-Lived Charge-Separated State Leading to DNA Damage through Hole Transfer
Journal of the American Chemical Society2003Vol. 125(52), pp. 16198–16199
Citations Over TimeTop 12% of 2003 papers
Kiyohiko Kawai, Tadao Takada, Takayoshi Nagai, Xichen Cai, Akira Sugimoto, Mamoru Fujitsuka, Tetsuro Majima
Abstract
The hole transfer causes the long-lived charge-separated state in DNA during the photosensitized one-electron oxidation of DNA. The combination of the transient absorption measurement and DNA damage quantification by HPLC clearly demonstrated that the yield of the DNA damage correlates well with the lifetime of the charge-separated state.
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