Assessing the Purity of Metal−Organic Frameworks Using Photoluminescence: MOF-5, ZnO Quantum Dots, and Framework Decomposition
Journal of the American Chemical Society2010Vol. 132(44), pp. 15487–15489
Citations Over TimeTop 10% of 2010 papers
Patrick Feng, John J. Perry, Stefan Nikodemski, Benjamin Jacobs, Scott Thomas Meek, Mark D. Allendorf
Abstract
Photoluminescence (PL) spectroscopy was used to characterize nanoscale ZnO impurities, amine-donor charge-transfer exciplexes, and framework decomposition in samples of MOF-5 prepared by various methods. The combined results cast doubt on previous reports describing MOF-5 as a semiconductor and demonstrate that PL as a tool for characterizing MOF purity possesses advantages such as simplicity, speed, and sensitivity over currently employed powder XRD MOF characterization methods.
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