In Situ Ru LII and LIII Edge X-ray Absorption Near Edge Structure of Electrodeposited Ruthenium Dioxide Films
The Journal of Physical Chemistry B2002Vol. 106(48), pp. 12373–12375
Citations Over Time
Abstract
The electronic properties of electrodeposited Ru oxide films supported on Au have been examined in situ by Ru LIII and LII edge X-ray absorption near edge structure (XANES) in acid media. The results obtained are consistent with the main voltammetric peak centered at 0.7 V vs RHE as being attributed to a redox couple involving formally Ru3+ and Ru4+ sites in the lattice. A linear correlation was found between the extent of oxidation of the film as derived from a deconvolution of the spectral features and the charge as determined from coulomteric analysis of the voltammetric curves. This observation suggests that only two Ru-based redox states are involved in this electrochemical process.
Related Papers
- → Comparative analysis of XANES and EXAFS for local structural characterization of disordered metal oxides(2021)28 cited
- → Investigation of Co nanoparticles with EXAFS and XANES(2004)75 cited
- → Determination of the Mo surface environment of Mo/TiO2 catalysts by EXAFS, XANES and PCA(1992)43 cited
- → Effects of Precursor Composition on the Local Structure of Cu Dispersed on Mesoporous Silica: A Detailed X-ray Absorption Spectroscopy Study(2004)37 cited
- → Surface characterization of ruthenium-tin oxide electrodes(1997)11 cited