Photoinduced Degradation Studies of Organic Solar Cell Materials Using Kelvin Probe Force and Conductive Scanning Force Microscopy
Citations Over TimeTop 10% of 2011 papers
Abstract
We investigated the photoinduced changes in the surface potential and conductivity for locally degraded active layers of organic solar cell materials using electrical modes of scanning force microscopy. Samples were degraded under different partial pressures of oxygen and humidity in the presence of light. Degraded and nondegraded areas were investigated by Kelvin Probe Force Microscopy (KPFM) and conductive scanning force microscopy (cSFM). The analysis allowed us to quantify the extent of degradation and compensate the contribution of the probe tip. Two typical blends used for organic solar cell, i.e., P3HT:PCBM and PCPDTBT:PCBM, were investigated. We observed that P3HT:PCBM photodegraded significantly more than PCPDTBT:PCBM for an environment containing oxygen. For short photodegradation times (1 h), we verified that changes in the surface potential and conductivity of P3HT:PCBM films were fully reversible after annealing. For individual layers of P3HT and PCBM, we found that only P3HT degrades. However, the blend material of P3HT and PCBM leads to an accelerated degradation supporting the interpretation that PCBM undergoes a series of oxidations in the blend.
Related Papers
- → Imaging the charge distribution within a single molecule(2012)331 cited
- → Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy(2016)37 cited
- → Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy(2019)9 cited
- → Atomic Force Microscopy ‐ AFM(2002)1 cited
- → Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2(2005)