Enrichment and Characterization of a Noble Gas Fullerene: Ar@C60
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Abstract
Ar@C60, synthesized by heating primarily C60 (with trace amounts of C70) under a high pressure of argon gas, was purified by high-performance liquid chromatography (HPLC) and examined by Fourier transform mass spectrometry (FTMS). The sample, which consisted of 0.1% Ar@C60, was dissolved in toluene and separated with HPLC using a COSMOSIL 5PYE column as the stationary phase and toluene as the eluent (UV detection). Ar@C60 was enriched by a factor of about 400 relative to the starting material. Ar@C60 was also examined by X-ray photoelectron spectroscopy (XPS) but was found to be sensitive to radiation damage and subsequent depletion. Low-energy collisional dissociation of Ar@C60+ in the FTMS yields primarily C58+, generated by loss of the argon atom and C2. The ionization potential of Ar@C60 was bracketed by charge-exchange reactions and was found to be between 7.53 and 7.8 eV, which is indistinguishable from that of C60 (7.65 eV).
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