Photoionization Yield vs Energy in H2O and D2O
The Journal of Physical Chemistry A2000Vol. 104(15), pp. 3349–3355
Citations Over TimeTop 10% of 2000 papers
Abstract
A simple conductivity jump method was used to measure the escaped solvated electron yield following two-photon excitation of water with Raman-shifted light from an amplified mode-locked Nd:YAG laser. Between 7.8 and 9.3 eV, the quantum efficiency for the escape yields changes from 1.9% to 22%, with an almost exponential dependence on the excitation energy. Quantum efficiency in D2O is smaller and resembles the H2O behavior at 0.35 eV lower energy. The quantum yield measured for one-photon excitation near the water absorption edge at 6.4 eV is a surprisingly large 1.3%. We propose that the mechanism for low energy photoionizaton of water is best described as a dissociative proton-coupled electron transfer to a preexisting trap.
Related Papers
- → Pronounced effects of interchannel coupling in high-energy photoionization(2013)23 cited
- → Total photoionization cross-sections of Ar and Xe in the energy range of 2.1–6.0keV(2006)13 cited
- → Photoionization spectrum of solvated electrons(1974)19 cited
- → Picosecond study of photoionization in aqueous solution(1981)7 cited
- Electron attachment as a probe of photoionization processes in liquid media(1981)