Synchrotron X-ray Diffraction and Infrared Spectroscopy Studies of C60H18 under High Pressure
The Journal of Physical Chemistry Letters2010Vol. 1(4), pp. 714–719
Citations Over Time
Honglei Ma, Xuemei Zhang, Bingbing Liu, Quanjun Li, Qifeng Zeng, Shidan Yu, Bo Zou, Tian Cui, Guangtian Zou, Zhenxian Liu, Thomas Wågberg, Bertil Sundqvist, Dag Noréus
Abstract
In situ high-pressure angle-dispersive synchrotron X-ray diffraction and high-pressure mid-infrared (IR) spectrum measurements of C60H18 were carried out up to 32 and 10.2 GPa, respectively. Our diffraction data indicated that the fcc structure of C60H18 was stable up to 32 GPa. The bulk modulus B0 was determined to be 21 ± 1.16 GPa, about 40% higher than that of C60. The C−H vibrations still existed up to 10.2 GPa, and the vibrational frequencies decreased with increasing pressure. IR-active vibrational frequencies and their corresponding eigenvectors of C60H18 were simulated by DMOL3. The effects of the hydrogen atoms attached to the fullerene molecular cage on the stability of the structure under high pressure are discussed.
Related Papers
- → Characterization of Z-DNA by Infrared Spectroscopy(2023)4 cited
- → The study of some normal and abnormal montmorillonites by thermal analysis and infrared spectroscopy(1987)8 cited
- → Chapter 3 Theory of infrared spectroscopy(2001)4 cited
- → The infrared spectrum of gaseous Sb4O6(1993)9 cited
- STUDIES IN MOLECULAR SPECTROSCOPY. MOLECULAR CONSTANTS FROM INFRARED BANDSHAPES. THE ATOMIC DISPLACEMENTS AND INTRAMOLECULAR FORCES IN TETRAFLUOROMETHANE AND THE INFRARED BAND SHAPES AND THE INTENSITIES OF THE INFRARED ACTIVE BANDS OF TETRAFLUOROMETHANE. THE C-F BOND DIPOLAR PROPERTIES(1957)