Nanowire Probes for High Resolution Combined Scanning Electrochemical Microscopy − Atomic Force Microscopy
Citations Over TimeTop 10% of 2005 papers
Abstract
We describe a method for the production of nanoelectrodes at the apex of atomic force microscopy (AFM) probes. The nanoelectrodes are formed from single-walled carbon nanotube AFM tips which act as the template for the formation of nanowire tips through sputter coating with metal. Subsequent deposition of a conformal insulating coating, and cutting of the probe end, yields a disk-shaped nanoelectrode at the AFM tip apex whose diameter is defined by the amount of metal deposited. We demonstrate that these probes are capable of high-resolution combined electrochemical and topographical imaging. The flexibility of this approach will allow the fabrication of nanoelectrodes of controllable size and composition, enabling the study of electrochemical activity at the nanoscale.
Related Papers
- → Nanoscale analysis of supported lipid bilayers using atomic force microscopy(2009)153 cited
- Nanoscopic oxidation of p-type and un-doped Si (100) surfaces using un-externally biased atomic force microscope tips (AFM) in the presence of selected organic solvents(2016)
- → Exploring Electro-Chemo-Mechanical Phenomena on the Nanoscale Using Scanning Probe Microscopy(2017)
- Investigation of the electronic transport in polarization-induced nanowires using conductive atomic force microscopy (AFM)(2013)
- Atomic scale contact formation: A combined Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) study(2008)