Probing the Nature of Defects in Graphene by Raman Spectroscopy
Nano Letters2012Vol. 12(8), pp. 3925–3930
Citations Over TimeTop 1% of 2012 papers
Axel Eckmann, Alexandre Felten, Artem Mishchenko, L. Britnell, Ralph Krupke, Kostya S. Novoselov, Cinzia Casiraghi
Abstract
Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D' peak is maximum (∼13) for sp(3)-defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.
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