Correction to Single Defect Center Scanning Near-Field Optical Microscopy on Graphene | doi.page

Correction to Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Nano Letters2013Vol. 13(8), pp. 3965–3965

Julia Tisler, Thomas Oeckinghaus, Rainer Stöhr, Roman Kolesov, Rolf Reuter, Friedemann Reinhard, Jörg Wrachtrup

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVAddition/CorrectionNEXTORIGINAL ARTICLEThis notice is a correctionCorrection to Single Defect Center Scanning Near-Field Optical Microscopy on GrapheneJulia Tisler*, Thomas Oeckinghaus, Rainer J. Stöhr, Roman Kolesov, Rolf Reuter, Friedemann Reinhard, and Jörg WrachtrupCite this: Nano Lett. 2013, 13, 8, 3965Publication Date (Web):July 17, 2013Publication History Published online17 July 2013Published inissue 14 August 2013https://pubs.acs.org/doi/10.1021/nl402495ahttps://doi.org/10.1021/nl402495acorrectionACS PublicationsCopyright © 2013 American Chemical Society. This publication is available under these Terms of Use. Request reuse permissions This publication is free to access through this site. Learn MoreArticle Views768Altmetric-Citations-LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail PDF (100 KB) Get e-Alertsclose Get e-Alerts

Abstract

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