Sample Preparation and Data Collection for High-Speed Fixed-Target Serial Femtosecond Crystallography
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Abstract
We have developed a protocol for high-speed xed-target serial femtosecond crystallography \(SFX) at Xray free electron lasers \(XFELs). Using the Roadrunner goniometer for fast scanning of microcrystals loaded on a micro-patterned silicon chip, our method allows for usage of the full 120 Hz repetition rate of the Linear Coherent Light Source \(LCLS). By synchronizing the sample exchange to the arrival of the LCLS X-ray pulses our approach results in most e cient use of sample material and beamtime. The presented protocol describes the loading of microcrystals on micro-patterned silicon chips and subsequent data collection using the Roadrunner goniometer installed at an XFEL beamline. Data collection can be performed either at cryogenic or room temperature. We further describe the Roadrunner control and data acquisition software and data processing using cppxfel. Due to the small sample amounts required and the low background scattering levels achievable, the method is ideally suited for data collection of precious microcrystals from viruses or membrane proteins, where often only limited amounts are available.
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