11 nm hard X-ray focus from a large-aperture multilayer Laue lens
Scientific Reports2013Vol. 3(1), pp. 3562–3562
Citations Over TimeTop 1% of 2013 papers
Xiaojing Huang, Hanfei Yan, Evgeny Nazaretski, R. Conley, Nathalie Bouet, Juan Zhou, Kenneth Lauer, Li Li, Daejin Eom, Daniel Legnini, Ross Harder, Ian Robinson, Yong S. Chu
Abstract
The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while offering a sufficient working distance. This achievement opens up opportunities of incorporating a variety of in-situ experiments into ultra high-resolution X-ray microscopy studies.
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