Electric field-induced hole transport in copper(i) thiocyanate (CuSCN) thin-films processed from solution at room temperature
Chemical Communications2012Vol. 49(39), pp. 4154–4156
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Pichaya Pattanasattayavong, Guy O. Ngongang Ndjawa, Kui Zhao, Kang Wei Chou, Nir Yaacobi‐Gross, Brian C. O’Regan, Aram Amassian, Thomas D. Anthopoulos
Abstract
The optical, structural and charge transport properties of solution-processed films of copper(I) thiocyanate (CuSCN) are investigated in this work. As-processed CuSCN films of ~20 nm in thickness are found to be nano-crystalline, highly transparent and exhibit intrinsic hole transporting characteristics with a maximum field-effect mobility in the range of 0.01-0.1 cm(2) V(-1) s(-1).
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