Metal–2D multilayered semiconductor junctions: layer-number dependent Fermi-level pinning
Journal of Materials Chemistry C2020Vol. 8(9), pp. 3113–3119
Citations Over TimeTop 10% of 2020 papers
Abstract
Thickness-dependent performance of metal–two-dimensional semiconductor junctions in electronics/optoelectronics have attracted increasing attention but, currently, little knowledge about the micro-mechanism of this thickness dependence is available.
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