Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold
Applied Physics Letters1999Vol. 75(10), pp. 1395–1397
Citations Over TimeTop 15% of 1999 papers
Abstract
Tapping-mode atomic force microscopy is used to image the conducting network of polyaniline inside organic blends. The greater stiffness of the conducting polymer phase with respect to the matrix leads to good resolution phase contrast imaging. Cross-section images provide a unique insight in the distribution of the conductive phase within the matrix.
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