Bending strain investigations on BSCCO(2223) tapes at 77 K applying a new bending technique

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Abstract

A new bending device was developed which allows continuous change of the bending radius of the BSCCO tape sample at 77 K and a simultaneous measurement of the critical currents. The samples are mounted free between two clamps. The special geometry of the arrangement insures over the whole range a sample shape with homogeneous curvature on a circle line without the help of mechanical parts. This bending strain rig avoids effects from additional thermal stresses due to the cooling from room temperature (bending) to 77 K (critical current measurement). We mainly present measurements on different Ag/AgMg sheathed standard conductors. The results obtained with the new method will be compared for some selected samples with the bending strain behavior measured in the conventional way, applying the bent at RT. The potential of the method being suitable for standardized bending experiments will be discussed.

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