Optical and electrical properties of proton-bombarded p-type GaAs

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Abstract

The effect of 300-keV proton bombardment and subsequent annealing on the optical absorption and electrical resistivity of bulk p-type (p=2×1018 and 1.4×1019 cm−3) GaAs has been studied. Proton doses were in the range 1013−1017 cm−2. It is found that bombardment-induced optical absorption increases monotonically, but sublinearly, with proton dose. The shape of the optical transmission spectrum indicates that bombardment creates a distribution of energy levels extending into the forbidden gap. Activation energies for annealing of the optical absorption have been determined from isothermal annealing data and range from ∼1.5 to ∼3.4 eV, which indicates that at least two kinds of defects are involved. Current-voltage measurements show that the average electrical resistivity of the bombarded layers goes through a maximum at ∼2.5×105 Ω cm at a proton dose of ∼3×1015 cm−2. It is shown that annealing can eliminate the bombardment-induced optical absorption while still retaining a high electrical resistivity. The optimum annealing time and temperature is a function of the proton dose. From these results a set of useful conditions for the proton-bombardment fabrication of stripe-geometry GaAs lasers is determined. Many qualitative similarities exist between the results presented here and those obtained in GaP, which are presented in the following paper.

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