Test of charge symmetry in n-p elastic scattering at 480 MeV

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation R. Abegg, J. Birchall, E. Cairns, H. Coombes, C. A. Davis, N. E. Davison, P. Delheij, P. W. Green, L. G. Greeniaus, H. P. Gubler, D. C. Healey, W. P. Lee, W. J. McDonald, C. A. Miller, G. A. Moss, G. R. Plattner, P. R. Poffenberger, G. Roy, J. Soukup, J. P. Svenne, R. Tkachuk, W. T. H. van Oers, G. D. Wait, Y. P. Zhang; Test of charge symmetry in n‐p elastic scattering at 480 MeV. AIP Conf. Proc. 15 November 1984; 123 (1): 1102–1109. https://doi.org/10.1063/1.34853 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search

Related Papers

• → Role of scattering in nanotransistors(2003)202 cited
• → Some key issues pertaining to analysis of small-angle scattering data affected by multiple scattering(2003)7 cited
• → X-ray scattering for the determination of fat content in dairy products(2011)5 cited
• → On the effects of high-order scattering in 3D cubical and rectangular furnaces(2008)1 cited
• → Polarimetric surface scattering omnidirectionally from distributed target(2002)