Circular grating interferometer for mapping transverse coherence area of X-ray beams
Applied Physics Letters2014Vol. 105(4)
Citations Over TimeTop 10% of 2014 papers
Xianbo Shi, Shashidhara Marathe, Michael Wojcik, Naresh Kujala, Albert T. Macrander, Lahsen Assoufid
Abstract
A circular grating interferometer was used to map the transverse coherence area of an X-ray beam. Due to the radial symmetry of the circular grating, coherence lengths along all transverse directions were obtained simultaneously by measuring the visibility decay of interferograms recorded at different distances behind a single circular π/2 phase grating. The technique is model-free and provides direct measurement of the complex coherence factor of the beam. The use of a circular grating also enables the unique capability of measuring the source shape profile. Sensitivity of this technique was demonstrated by detecting the small source tilt of a few degrees.
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