Study of dynamic current distribution in logic circuits by Joule displacement microscopy
Applied Physics Letters1987Vol. 50(3), pp. 167–168
Abstract
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.
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