Single-shot x-ray phase-contrast and dark-field imaging based on coded binary phase mask
Applied Physics Letters2021Vol. 119(1)
Citations Over TimeTop 10% of 2021 papers
Abstract
We introduce a coded-mask-based multi-contrast imaging method for high-resolution phase-contrast and dark-field imaging. The method uses a binary phase mask designed to provide an ultra-high-contrast pattern and reference-free single-shot measurement and an algorithm based on maximum-likelihood optimization and automatic differentiation to perform simultaneous reconstruction of absorption, phase, and dark-field object images. Further, we demonstrate that the method has great potential for real-time quantitative phase imaging and wavefront sensing when combined with deep learning.
Related Papers
- → A new method for information retrieval in two-dimensional grating-based X-ray phase contrast imaging(2012)14 cited
- → A phase retrieval algorithm for X-ray phase contrast imaging(2012)4 cited
- X-RAY PHASE CONTRAST IMAGING(2005)
- → Phase-Contrast and Dark-Field Imaging - Advanced Contrast Modalities in X-Ray Radiology(2009)1 cited
- Phase retrieval for hard x-ray in-line phase contrast imaging(2007)