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Photoacoustic characterisation of semiconductor surfaces: cadmium telluride
High Temperatures-High Pressures1998Vol. 30(5), pp. 613–618
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Abstract
By means of a technique based on thermal process detection, namely photoacoustics. the correlation between the surface recombination veloc~ty in cadmium telluride and the surface rouzhness is explored. This is achieved through the investi_gation of the photoacoustic signal as a function of the modulation frequency in a heat-transmission configuration and the use of atomic force microscopic analysis.
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