Neutron and X-ray Reflectometry: Solid Multilayers and Crumpling Films
Australian Journal of Physics1997Vol. 50(2), pp. 391–405
Citations Over TimeTop 15% of 1997 papers
Abstract
The structures of films and interfaces at the molecular level can be determined from specular reflectivity measurements using neutrons and X-rays. A general introduction to the principles of neutron and X-ray reflectometry is given. Illustrative examples of the application of neutron and X-ray reflectometry to problems of chemical and physical interest are presented.
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