Photon Statistics of Semiconductor Microcavity Lasers
Physical Review Letters2007Vol. 98(4), pp. 043906–043906
Citations Over TimeTop 1% of 2007 papers
S. M. Ulrich, Christopher Gies, Serkan Ateş, Jan Wiersig, Stephan Reitzenstein, C. Hofmann, Andreas Löffler, A. Forchel, F. Jahnke, Peter Michler
Abstract
We present measurements of first- and second-order coherence of quantum-dot micropillar lasers together with a semiconductor laser theory. Our results show a broad threshold region for the observed high-beta microcavities. The intensity jump is accompanied by both pronounced photon intensity fluctuations and strong coherence length changes. The investigations clearly visualize a smooth transition from spontaneous to predominantly stimulated emission which becomes harder to determine for high beta. In our theory, a microscopic approach is used to incorporate the semiconductor nature of quantum dots. The results are in agreement with the experimental intensity traces and the photon statistics measurements.
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