Genomic Regions Associated With Race‐Specific Anthracnose Resistance in the Andean Diversity Panel of Common Bean

Abstract

ABSTRACT Anthracnose (ANT) caused by the fungus Colletotrichum lindemuthianum causes major yield losses in common bean globally. Identification of sources of resistance and understanding the genomic basis of resistance is critical to the development of ANT‐resistant varieties. The objectives of this study were to identify (i) Andean germplasm with superior resistance to 17 races of C. lindemuthianum from the Andean gene pool and (ii) the genomic regions associated with resistance to these 17 races. A total of 425 lines belonging to the Andean diversity panel were evaluated for resistance to 17 races of C. lindemuthianum . Association analyses were performed in TASSEL 5.0 using a mixed linear model, with the first five PCs as fixed covariates and the kinship matrix as a random effect; SNPs with MAF < 0.05 were excluded ( n = 21,524), and we applied a Bonferroni threshold ( p < 2.3 × 10 −6 ). Nine genotypes in diverse market classes were identified as having superior resistance to the 17 races and can be used as sources of resistance in breeding. We identified five genomic regions (Pv01, two on Pv04, Pv02 and Pv06) associated with resistance for 16 of the 17 races tested; Pv01, Pv02 and Pv04 overlap the Co‐1, Co‐u and Co‐3 loci, respectively, and the region on Pv06 is reported for the first time for race 566. Each region conferred race‐specific resistance. Pyramiding the five identified genomic regions could provide both vertical and horizontal resistance to ensure durable resistance to 16 of the 17 races used in this study.