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Physical Correlation between Stochasticity and Process-Induced Damage in Ferroelectric Memory Devices
SSRN Electronic Journal2025
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Ryun‐Han Koo, Seung Whan Kim, Gyuweon Jung, Kangwook Choi, Sangwoo Ryu, Ji Hyun Kim, Jiseong Im, Sungho Park, Jonghyun Ko, Sung‐Tae Lee, Daewoong Kwon, Wonjun Shin
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