C. E. Bouldin
Publications by Year
Research Areas
X-ray Spectroscopy and Fluorescence Analysis, Electron and X-Ray Spectroscopy Techniques, Surface and Thin Film Phenomena, Semiconductor materials and interfaces, X-ray Diffraction in Crystallography
Most-Cited Works
- → Parallel calculation of electron multiple scattering using Lanczos algorithms(2002)494 cited
- → Diffraction anomalous fine structure: A new x-ray structural technique(1992)223 cited
- → Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb(1990)137 cited
- → Inclusion of local structure effects in theoretical x-ray resonant scattering amplitudes usingab initiox-ray-absorption spectra calculations(1998)115 cited
- → Gold-induced germanium crystallization(1992)78 cited
- → Interfacial properties of ZrO2 on silicon(2003)73 cited
- → Surface structure of cadmium selenide nanocrystallites(1997)72 cited
- → Radial distribution function in x-ray-absorption fine structure(1992)63 cited
- → Conservation of bond lengths in strained Ge-Si layers(1991)60 cited
- → Extended x-ray absorption fine structure study of AlxGa(1−x)N films(1997)56 cited