N. Kranitis
National and Kapodistrian University of Athens(GR)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Low-power high-performance VLSI design, Advanced Data Compression Techniques
Most-Cited Works
- → Software-Based Self-Testing of Embedded Processors(2005)190 cited
- → Hybrid-SBST Methodology for Efficient Testing of Processor Cores(2008)62 cited
- → Instruction-Based Self-Testing of Processor Cores(2003)51 cited
- → Deterministic software-based self-testing of embedded processor cores(2002)46 cited
- → A 3.3 Gbps CCSDS 123.0-B-1 Multispectral & Hyperspectral Image Compression Hardware Accelerator on a Space-Grade SRAM FPGA(2018)44 cited
- → A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAM(2005)43 cited
- → Effective Software Self-Test Methodology for Processor Cores(2002)41 cited
- → Application and analysis of rt-level software-based self-testing for embedded processor cores(2004)40 cited
- → Design status of ASPIICS, an externally occulted coronagraph for PROBA-3(2015)35 cited