A. Benninghoven
University of Münster(DE)
Publications by Year
Research Areas
Ion-surface interactions and analysis, Mass Spectrometry Techniques and Applications, Analytical chemistry methods development, Electron and X-Ray Spectroscopy Techniques, Integrated Circuits and Semiconductor Failure Analysis
Most-Cited Works
- Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends(1987)
- → Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)(1994)508 cited
- → Developments in secondary ion mass spectroscopy and applications to surface studies(1975)453 cited
- → Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)(1973)445 cited
- → Detection, identification, and structural investigation of biologically important compounds by secondary ion mass spectrometry(1978)368 cited
- → Secondary-ion emission of amino acids(1976)291 cited
- → Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemission