James M. LeBeau
Massachusetts Institute of Technology(US)
Publications by Year
Research Areas
Electronic and Structural Properties of Oxides, Electron and X-Ray Spectroscopy Techniques, Semiconductor materials and devices, Advanced Electron Microscopy Techniques and Applications, Ferroelectric and Piezoelectric Materials
Most-Cited Works
- → Physical Mechanisms behind the Field‐Cycling Behavior of HfO2‐Based Ferroelectric Capacitors(2016)881 cited
- → Giant piezoelectricity of Sm-doped Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 single crystals(2019)861 cited
- → On the structural origins of ferroelectricity in HfO2 thin films(2015)621 cited
- → Structural Changes Underlying Field‐Cycling Phenomena in Ferroelectric HfO2 Thin Films(2016)409 cited
- → Quantitative Atomic Resolution Scanning Transmission Electron Microscopy(2008)378 cited
- → A comprehensive study on the structural evolution of HfO2thin films doped with various dopants(2017)333 cited
- → Transition from Battery to Pseudocapacitor Behavior via Structural Water in Tungsten Oxide(2017)240 cited
- → Experimental quantification of annular dark-field images in scanning transmission electron microscopy(2008)238 cited
- → Position averaged convergent beam electron diffraction: Theory and applications(2009)227 cited
- → Standardless Atom Counting in Scanning Transmission Electron Microscopy(2010)224 cited