C. Jeynes
University of Surrey(GB)Tredegar (United States)(US)
Publications by Year
Research Areas
Ion-surface interactions and analysis, Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis, Electron and X-Ray Spectroscopy Techniques, Silicon and Solar Cell Technologies
Most-Cited Works
- → Simulated annealing analysis of Rutherford backscattering data(1997)636 cited
- → Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool(2003)183 cited
- → Advanced physics and algorithms in the IBA DataFurnace(2007)180 cited
- → Critical review of the current status of thickness measurements for ultrathin SiO 2 on Si Part V: Results of a CCQM pilot study(2004)139 cited
- → “Total IBA” – Where are we?(2011)119 cited
- → Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry(2012)116 cited