Emmanuel Nolot
Commissariat à l'Énergie Atomique et aux Énergies Alternatives(FR)CEA Grenoble(FR)Laboratoire d'Électronique des Technologies de l'Information(FR)Université Grenoble Alpes(FR)
Publications by Year
Research Areas
Phase-change materials and chalcogenides, Semiconductor materials and devices, Chalcogenide Semiconductor Thin Films, Electron and X-Ray Spectroscopy Techniques, X-ray Spectroscopy and Fluorescence Analysis
Most-Cited Works
- → A novel 2-step ALD route to ultra-thin MoS2films on SiO2through a surface organometallic intermediate(2016)80 cited
- → Germanium, antimony, tellurium, their binary and ternary alloys and the impact of nitrogen: An X-ray photoelectron study(2020)73 cited
- → Role of vacancy defects in Al doped ZnO thin films for optoelectronic devices(2017)69 cited
- → Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching(2020)36 cited
- → Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization(2019)34 cited
- → Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene