Magdy S. Abadir
Abt Global (United States)(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Formal Methods in Verification, VLSI and FPGA Design Techniques, Low-power high-performance VLSI design
Most-Cited Works
- → A Knowledge-Based System for Designing Testable VLSI Chips(1985)229 cited
- → Logic design verification via test generation(1988)198 cited
- → Functional Testing of Semiconductor Random Access Memories(1983)184 cited
- → Challenges and Trends in Modern SoC Design Verification(2017)102 cited
- → Debugging sequential circuits using Boolean satisfiability(2005)68 cited
- → Post-verification debugging of hierarchical designs(2005)68 cited
- → On correlating structural tests with functional tests for speed binning of high performance design(2006)67 cited