Nur A. Touba
The University of Texas at Austin(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Engineering and Test Systems, Low-power high-performance VLSI design
Most-Cited Works
- → Survey of Test Vector Compression Techniques(2006)437 cited
- → Static compaction techniques to control scan vector power dissipation(2002)352 cited
- → An efficient test vector compression scheme using selective huffman coding(2003)275 cited
- → Cost-effective approach for reducing soft error failure rate in logic circuits(2004)272 cited
- → Test vector decompression via cyclical scan chains and its application to testing core-based designs(2002)271 cited
- → Scan vector compression/decompression using statistical coding(2003)264 cited
- → Test vector encoding using partial LFSR reseeding(2002)229 cited