Crispin Hetherington
Lund University(SE)National Evolutionary Synthesis Center(US)
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, Advanced Materials Characterization Techniques, Advanced X-ray Imaging Techniques, Integrated Circuits and Semiconductor Failure Analysis
Most-Cited Works
- → Enhanced and Stable Field Emission from in Situ Nitrogen-Doped Few-Layered Graphene Nanoflakes(2011)162 cited
- → Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution(2001)133 cited
- → Aberration‐Corrected Imaging of Active Sites on Industrial Catalyst Nanoparticles(2007)124 cited
- → Sub-Ångstrom high-resolution transmission electron microscopy at 300keV(2001)116 cited
- → The atomic structure of the NiSi2-(001)Si interface(1984)104 cited
- → Materials Advances through Aberration-Corrected Electron Microscopy(2006)101 cited