Günther Benstetter
Publications by Year
Research Areas
Force Microscopy Techniques and Applications, Integrated Circuits and Semiconductor Failure Analysis, Metal and Thin Film Mechanics, Diamond and Carbon-based Materials Research, Semiconductor materials and devices
Most-Cited Works
- → Transparent flexible thermoelectric material based on non-toxic earth-abundant p-type copper iodide thin film(2017)370 cited
- → Hybrid 2D–CMOS microchips for memristive applications(2023)280 cited
- → C-AFM-based thickness determination of thin and ultra-thin SiO 2 films by use of different conductive-coated probe tips(2006)100 cited
- → Nanostructured fuzz growth on tungsten under low-energy and high-flux He irradiation(2015)85 cited
- → High-flux He+ irradiation effects on surface damages of tungsten under ITER relevant conditions(2016)69 cited
- → Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy(2005)54 cited
- → Degradation of polycrystalline HfO2-based gate dielectrics under nanoscale electrical stress(2011)53 cited
- → A review of advanced scanning probe microscope analysis of functional films and semiconductor devices(2009)49 cited
- → SPM investigation of diamond-like carbon and carbon nitride films(2003)45 cited
- → Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline $\hbox{Al}_{2}\hbox{O}_{3}\hbox{-Based}$ Devices Studied With AFM-Related Techniques(2010)36 cited