N.P. Barradas
Publications by Year
Research Areas
Semiconductor materials and devices, Ion-surface interactions and analysis, Metal and Thin Film Mechanics, X-ray Spectroscopy and Fluorescence Analysis, Electron and X-Ray Spectroscopy Techniques
Most-Cited Works
- → Simulated annealing analysis of Rutherford backscattering data(1997)636 cited
- → Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool(2003)183 cited
- → Advanced physics and algorithms in the IBA DataFurnace(2007)180 cited
- → Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry(2012)116 cited
- → International Atomic Energy Agency intercomparison of ion beam analysis software(2007)100 cited
- → Ion beam analysis of fusion plasma-facing materials and components: facilities and research challenges(2019)94 cited
- → Magnetoresistance enhancement in specular, bottom-pinned, Mn83Ir17 spin valves with nano-oxide layers(2000)82 cited
- → Tuning of the surface plasmon resonance in TiO2/Au thin films grown by magnetron sputtering: The effect of thermal annealing(2011)81 cited
- → Effect of free layer thickness and shape anisotropy on the transfer curves of MgO magnetic tunnel junctions(2008)76 cited
- → Summary of “IAEA intercomparison of IBA software”(2007)76 cited