B. I. Boyanov
Publications by Year
Research Areas
Semiconductor materials and interfaces, Semiconductor materials and devices, Surface and Thin Film Phenomena, Electron and X-Ray Spectroscopy Techniques, Acoustic Wave Resonator Technologies
Most-Cited Works
- → Tri-Gate fully-depleted CMOS transistors: fabrication, design and layout(2004)219 cited
- → Re-investigation of titanium silicalite by X-ray absorption spectroscopy: Are the novel titanium sites real?(1993)95 cited
- → X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface(2011)50 cited
- → Silicon nano-transistors for logic applications(2003)49 cited
- → Estimation of measurement uncertainties in XAFS data(1999)49 cited
- → Film thickness effects in the Co–Si1−xGex solid phase reaction(1998)35 cited
- → On‐Wafer Crystallization of Ultralow‐κ Pure Silica Zeolite Films(2009)30 cited
- → Support and Temperature Effects in Platinum Clusters. 2. Electronic Properties(1996)30 cited
- → Support and Temperature Effects in Platinum Clusters. 1. Spatial Structure(1996)25 cited
- → Role of the substrate strain in the sheet resistance stability of NiSi deposited on Si(100)(1999)21 cited