R. N. S. Sodhi
University of Toronto(CA)
Publications by Year
Research Areas
Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis, Advanced Chemical Physics Studies, Semiconductor materials and devices, Dental materials and restorations
Most-Cited Works
- → Time-of-flight secondary ion mass spectrometry (TOF-SIMS):—versatility in chemical and imaging surface analysis(2004)316 cited
- → Interaction between Sodium Hypochlorite and Chlorhexidine Gluconate(2007)315 cited
- → Surface characterization of esterified cellulosic fibers by XPS and FTIR Spectroscopy(2001)250 cited
- → Reference energies for inner shell electron energy-loss spectroscopy(1984)248 cited
- → Electrical Resistance of AgTS–S(CH2)n−1CH3//Ga2O3/EGaIn Tunneling Junctions(2012)231 cited
- → Surface electronic structure of plasma-treated indium tin oxides(2001)202 cited
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