S. Biesemans
IMEC(BE)
Publications by Year
Research Areas
Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Integrated Circuits and Semiconductor Failure Analysis, Ferroelectric and Negative Capacitance Devices, Semiconductor materials and interfaces
Most-Cited Works
- → Gate-induced quantum-confinement transition of a single dopant atom in a silicon FinFET(2008)308 cited
- → Transport Spectroscopy of a Single Dopant in a Gated Silicon Nanowire(2006)261 cited
- → Review of FINFET technology(2009)163 cited
- → 3D stacked IC demonstration using a through Silicon Via First approach(2008)141 cited
- → Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession(2010)120 cited
- → Comprehensive analysis of the impact of single and arrays of through silicon vias induced stress on high-k / metal gate CMOS performance(2010)119 cited
- → Future Logic Scaling: Towards Atomic Channels and Deconstructed Chips