Jeremiah Croshaw
University of Alberta(CA)
Publications by Year
Research Areas
Semiconductor materials and devices, Force Microscopy Techniques and Applications, Surface and Thin Film Phenomena, Electron and X-Ray Spectroscopy Techniques, Electronic and Structural Properties of Oxides
Most-Cited Works
- → Lithography for robust and editable atomic-scale silicon devices and memories(2018)121 cited
- → Atomically Precise Manufacturing of Silicon Electronics(2024)54 cited
- → Electrostatic Landscape of a Hydrogen-Terminated Silicon Surface Probed by a Moveable Quantum Dot(2019)42 cited
- → Deep learning-guided surface characterization for autonomous hydrogen lithography(2020)28 cited
- → Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy(2020)20 cited
- → Detecting and Directing Single Molecule Binding Events on H-Si(100) with Application to Ultradense Data Storage(2019)20 cited
- → Resolving and Tuning Carrier Capture Rates at a Single Silicon Atom Gap State(2017)19 cited
- → Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness(2024)6 cited
- Autonomous Atomic Scale Manufacturing Through Machine Learning(2019)
- → Electronic structures of atomic silicon dimer wires as a function of length(2025)2 cited