Wolfgang Goes
Silvaco (United Kingdom)(GB)
Publications by Year
Research Areas
Magnetic properties of thin films, Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Advanced Memory and Neural Computing, Integrated Circuits and Semiconductor Failure Analysis
Most-Cited Works
- → The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps(2011)464 cited
- → The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability(2010)283 cited
- → A two-stage model for negative bias temperature instability(2009)211 cited
- → Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence(2018)131 cited
- → Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise(2009)114 cited
- → Recent advances in understanding the bias temperature instability(2010)105 cited
- → On the microscopic structure of hole traps in pMOSFETs(2014)97 cited
- → Theoretical models of hydrogen-induced defects in amorphous silicon dioxide(2015)94 cited
- → Understanding negative bias temperature instability in the context of hole trapping (Invited Paper)(2009)63 cited
- → A Rigorous Study of Measurement Techniques for Negative Bias Temperature Instability(2008)62 cited