Yaw S. Obeng
National Institute of Standards and Technology(US)National Institute of Standards(EG)
Publications by Year
Research Areas
3D IC and TSV technologies, Integrated Circuits and Semiconductor Failure Analysis, Electronic Packaging and Soldering Technologies, Semiconductor materials and devices, Copper Interconnects and Reliability
Most-Cited Works
- → Toward Clean and Crackless Transfer of Graphene(2011)803 cited
- → Metrology for the next generation of semiconductor devices(2018)459 cited
- → Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films(1992)263 cited
- → Langmuir films of C60 at the air-water interface(1991)176 cited
- → Electrogenerated chemiluminescence. 53. Electrochemistry and emission from adsorbed monolayers of a tris(bipyridyl)ruthenium(II)-based surfactant on gold and tin oxide electrodes(1991)174 cited
- → Nanoporous Ultralow Dielectric Constant Organosilicates Templated by Triblock Copolymers(2002)131 cited