Maoxiang Yi
Hefei University of Technology(CN)Anhui Institute of Information Technology(CN)
Publications by Year
Research Areas
Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing, Physical Unclonable Functions (PUFs) and Hardware Security, Advancements in Semiconductor Devices and Circuit Design, Semiconductor materials and devices
Most-Cited Works
- → Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology(2017)114 cited
- → High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure(2020)76 cited
- → Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator(2021)58 cited
- → A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology(2015)58 cited
- → A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application(2018)56 cited
- → Real-time Cd2+ detection at sub-femtomolar level in various liquid media by an aptasensor integrated with microfluidic enrichment(2020)40 cited