Thorsten Dziomba
Physikalisch-Technische Bundesanstalt(DE)
Publications by Year
Research Areas
Advanced Measurement and Metrology Techniques, Force Microscopy Techniques and Applications, Surface Roughness and Optical Measurements, Scientific Measurement and Uncertainty Evaluation, Near-Field Optical Microscopy
Most-Cited Works
- → Comeback of epitaxial graphene for electronics: Large-area growth of bilayer-free graphene on SiC(2016)166 cited
- → Accurate and traceable calibration of one-dimensional gratings(2005)110 cited
- → Accurate and traceable calibration of two-dimensional gratings(2007)110 cited
- → The European nanometrology landscape(2011)84 cited
- → A landmark-based 3D calibration strategy for SPM(2007)73 cited
- → Graphene p-n junction arrays as quantum-Hall resistance standards(2011)57 cited
- → Homogeneous Large-Area Quasi-Free-Standing Monolayer and Bilayer Graphene on SiC(2019)34 cited
- → Self-calibration of scanning probe microscope: mapping the errors of the instrument(2008)28 cited
- → Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz(2019)28 cited
- → Architecture and Surface Properties of Monomolecular Films of a Cyanine Dye and Their Light-Induced Modification(1999)21 cited