S. J. O’Shea
Agency for Science, Technology and Research(SG)Institute of Materials Research and Engineering(SG)
Publications by Year
Research Areas
Force Microscopy Techniques and Applications, Semiconductor materials and devices, Mechanical and Optical Resonators, Integrated Circuits and Semiconductor Failure Analysis, Molecular Junctions and Nanostructures
Most-Cited Works
- → Atomic-force-microscope study of contact area and friction onNbSe2(1997)248 cited
- → Dynamic interactions between microbubbles in water(2010)203 cited
- → Lateral stiffness of the tip and tip-sample contact in frictional force microscopy(1997)152 cited
- → Measuring Surface-Induced Conformational Changes in Proteins(1999)147 cited
- → Conducting atomic force microscopy study of silicon dioxide breakdown(1995)147 cited
- → Surface stress effects on the resonance properties of cantilever sensors(2005)145 cited
- → Atomic force microscopy of local compliance at solid—liquid interfaces